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The impact of ultra-thin titania interlayers on open circuit voltage and carrier lifetime in thin film solar cells

Type:

Journal

Info:

Applied Physics Letters 108, 113301 (2016)

Date:

2016-03-03

DOI:

http://dx.doi.org/10.1063/1.4944049

Author Information

Name	Institution
David Moerman	University of Washington
Hyungchul (GaTech) Kim	Georgia Institute of Technology
Adam E. Colbert	University of Washington
Samuel Graham	Georgia Institute of Technology
David S. Ginger	University of Washington

Films

Plasma TiO₂

Hardware used: Veeco - Ultratech - Cambridge NanoTech Fiji

TDMATi, tetrakis(dimethylamido)titanium, titanium dimethylamide, (Me₂N)₄Ti

CAS#: 3275-24-9

CAS#: 7782-44-7

Deposition Temperature Range N/A

Film/Plasma Properties

Characteristic: Work Function

Analysis: Scanning Kelvin Probe Microscopy (SKPM)

Diagnostic: -

Characteristic: Lifetime

Analysis: Scanning Kelvin Probe Microscopy (SKPM)

Diagnostic: -

Characteristic: Morphology, Roughness, Topography

Analysis: Scanning Kelvin Probe Microscopy (SKPM)

Diagnostic: -

Substrates

Notes

777