The impact of ultra-thin titania interlayers on open circuit voltage and carrier lifetime in thin film solar cells
Type:
Journal
Info:
Applied Physics Letters 108, 113301 (2016)
Date:
2016-03-03
Author Information
| Name | Institution |
|---|---|
| David Moerman | University of Washington |
| Hyungchul (GaTech) Kim | Georgia Institute of Technology |
| Adam E. Colbert | University of Washington |
| Samuel Graham | Georgia Institute of Technology |
| David S. Ginger | University of Washington |
Films
Plasma TiO2
Film/Plasma Properties
Characteristic: Work Function
Analysis: Scanning Kelvin Probe Microscopy (SKPM)
Characteristic: Lifetime
Analysis: Scanning Kelvin Probe Microscopy (SKPM)
Characteristic: Morphology, Roughness, Topography
Analysis: Scanning Kelvin Probe Microscopy (SKPM)
Substrates
Notes
| 777 |