Publication Information

Title:
Localized dielectric breakdown and antireflection coating in metal-oxide-semiconductor photoelectrodes
Type:
Journal
Info:
Nature Materials volume 16, pages 127-131 (2017)
Date:
2016-11-07

Author Information

Name Institution
Li JiUniversity of Texas at Austin
Hsien-Yi HsuUniversity of Texas at Austin
Xiaohan LiUniversity of Texas at Austin
Kai HuangUniversity of Texas at Austin
Ye ZhangUniversity of Texas at Austin
Jack C. LeeUniversity of Texas at Austin
Allen J. BardUniversity of Texas at Austin
Edward T. YuUniversity of Texas at Austin

Films


Film/Plasma Properties

Characteristic: Current Density
Analysis: Linear Sweep Voltammetry

Characteristic: Efficiency
Analysis: IPCE, Incident-Photon-to-Current Conversion Efficiency

Substrates

Keywords

Notes

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