Plasma-assisted atomic layer deposition of nickel oxide as hole transport layer for hybrid perovskite solar cells

Type:
Journal
Info:
J. Mater. Chem. C, 2019, 7, 12532-12543
Date:
2019-09-17

Author Information

Name Institution
Dibyashree KoushikEindhoven University of Technology
Marko JoštHelmholtz-Zentrum Berlin für Materialien und Energie GmbH
Algirdas DučinskasEindhoven University of Technology
Claire BurgessEindhoven University of Technology
Valerio ZardettoSolliance Solar Research
Christ WeijtensEindhoven University of Technology
Marcel A. VerheijenEindhoven University of Technology
Erwin (W.M.M.) KesselsEindhoven University of Technology
Steve AlbrechtHelmholtz-Zentrum Berlin für Materialien und Energie GmbH
Mariadriana CreatoreEindhoven University of Technology

Films


Film/Plasma Properties

Characteristic: Thickness
Analysis: Ellipsometry

Characteristic: Refractive Index
Analysis: Ellipsometry

Characteristic: Extinction Coefficient
Analysis: Ellipsometry

Characteristic: Uniformity
Analysis: Ellipsometry

Characteristic: Crystallinity, Crystal Structure, Grain Size, Atomic Structure
Analysis: XRD, X-Ray Diffraction

Characteristic: Chemical Composition, Impurities
Analysis: ARXPS, Angle Resolved X-ray Photoelectron Spectroscopy

Characteristic: Wetting Angle
Analysis: Contact Angle Measurement

Characteristic: Images
Analysis: SEM, Scanning Electron Microscopy

Characteristic: Images
Analysis: TEM, Transmission Electron Microscope

Characteristic: Valence Band Maximum
Analysis: UPS, Ultraviolet Photoemission Spectroscopy

Characteristic: Ionization Energy
Analysis: UPS, Ultraviolet Photoemission Spectroscopy

Characteristic: Photoluminescence
Analysis: PL, PhotoLuminescence

Characteristic: Carrier Concentration
Analysis: EIS, Electrochemical Impedance Spectroscopy

Characteristic: Open Circuit Voltage
Analysis: I-V, Current-Voltage Measurements

Characteristic: Short Circuit Current
Analysis: I-V, Current-Voltage Measurements

Characteristic: Fill Factor
Analysis: I-V, Current-Voltage Measurements

Characteristic: Power Conversion Efficiency
Analysis: I-V, Current-Voltage Measurements

Characteristic: EQE, External Quantum Efficiency
Analysis: Custom

Substrates

Silicon

Keywords

Solar

Notes

1598