Search 1530 plasma ALD publications by:
Search 1530 plasma ALD publications by:
Publication Information
Title:
Reliability and failure physics of GaN HEMT, MIS-HEMT and p-gate HEMTs for power switching applications: Parasitic effects and degradation due to deep level effects and time-dependent breakdown phenomena
Type:
Journal
Info:
2015 IEEE 3rd Workshop on Wide Bandgap Power Devices and Applications (WiPDA)
Date:
2015-11-02
Author Information
Name | Institution |
---|---|
Enrico Zanoni | University of Padova |
Matteo Meneghini | University of Padova |
Gaudenzio Meneghesso | University of Padova |
Davide Bisi | University of Padova |
Isabella Rossetto | University of Padova |
Antonio Stocco | University of Padova |
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Keywords
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479 |
Popular Precursors
Top Authors
Erwin (W.M.M.) Kessels |
Hyeongtag Jeon |
Hyungjun Kim |
Mauritius C. M. (Richard) van de Sanden |
Christophe Detavernier |