Highly reflective polymeric substrates functionalized utilizing atomic layer deposition
Type:
Journal
Info:
Applied Physics Letters 107, 061602 (2015)
Date:
2015-07-28
Author Information
| Name | Institution |
|---|---|
| Ana Zuzuarregui | CIC Nanogune Consolider |
| Borja Coto | IK4-Tekniker |
| Jorge RodrÃguez | Torresol Energy (SENER Group) |
| Keith E. Gregorczyk | CIC Nanogune Consolider |
| Unai Ruiz de Gopegui | IK4-Tekniker |
| Javier Barriga | IK4-Tekniker |
| Mato Knez | CIC Nanogune Consolider |
Films
Film/Plasma Properties
Characteristic: Images
Analysis: SEM, Scanning Electron Microscopy
Characteristic: Images
Analysis: Optical Microscopy
Characteristic: Morphology, Roughness, Topography
Analysis: AFM, Atomic Force Microscopy
Characteristic: Hardness
Analysis: Nanoindentation
Substrates
| PTFE |
Notes
| Examined O2 plasma pretreatement of Teflon prior to thermal ALD TiO2 process. |
| 382 |