Title: Total-dose radiation response and and post-irradiation annealing response of Hafnium capacitors
Type: Conference Proceedings
Info: 2016 Joint IEEE International Symposium on the Applications of Ferroelectrics, European Conference on Application of Polar Dielectrics, and Piezoelectric Force Microscopy Workshop (ISAF/ECAPD/PFM)
Date: 2016-08-21
DOI: http://dx.doi.org/10.1109/ISAF.2016.7578103
Name
Institution
Xi'an Jiaotong University
Xi'an Jiaotong University
Xi'an Jiaotong University
352535-01-4
Characteristic
Analysis
Diagnostic
Midgap Voltage
C-V, Capacitance-Voltage Measurements
-
Interface Trap Density
C-V, Capacitance-Voltage Measurements
-
Silicon
Radiation Hardness
973
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