Publication Information

Title: Enhanced electron field emission properties of high aspect ratio silicon nanowire-zinc oxide core-shell arrays

Type: Journal

Info: Phys. Chem. Chem. Phys., 2012, 14, 4614-4619

Date: 2012-01-24

DOI: http://dx.doi.org/10.1039/c2cp40238f

Author Information

Name

Institution

Nanyang Technological University

Nanyang Technological University

Nanyang Technological University

Nanyang Technological University

National University Singapore

Nanyang Technological University

Nanyang Technological University

Films

Deposition Temperature Range N/A

557-20-0

7782-44-7

Film/Plasma Properties

Characteristic

Analysis

Diagnostic

Electron Field Emission

Unknown

-

Threshold Voltage

I-V, Current-Voltage Measurements

Asylum Research MFP-3D

Morphology, Roughness, Topography

SEM, Scanning Electron Microscopy

JEOL JSM-7600F

Crystallinity, Crystal Structure, Grain Size, Atomic Structure

TEM, Transmission Electron Microscope

JEOL 2100F

Crystallinity, Crystal Structure, Grain Size, Atomic Structure

Electron Diffraction

-

Chemical Composition, Impurities

EDS, EDX, Energy Dispersive X-ray Spectroscopy

-

Morphology, Roughness, Topography

AFM, Atomic Force Microscopy

Asylum Research MFP-3D

Photoluminescence

PL, PhotoLuminescence

-

Substrates

Silicon

Keywords

Notes

129



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