Publication Information

Title:
Enhanced electron field emission properties of high aspect ratio silicon nanowire-zinc oxide core-shell arrays
Type:
Journal
Info:
Phys. Chem. Chem. Phys., 2012, 14, 4614-4619
Date:
2012-01-24

Author Information

Name Institution
Vinayak S. KaleNanyang Technological University
Rajiv Ramanujam PrabhakarNanyang Technological University
Stevin S. PramanaNanyang Technological University
Manohar RaoNanyang Technological University
Chorng-Haur SowNational University Singapore
K. B. JineshNanyang Technological University
Subodh G. MhaisalkarNanyang Technological University

Films

Plasma ZnO


Film/Plasma Properties

Characteristic: Electron Field Emission
Analysis: -

Characteristic: Threshold Voltage
Analysis: I-V, Current-Voltage Measurements

Characteristic: Morphology, Roughness, Topography
Analysis: SEM, Scanning Electron Microscopy

Characteristic: Crystallinity, Crystal Structure, Grain Size, Atomic Structure
Analysis: TEM, Transmission Electron Microscope

Characteristic: Crystallinity, Crystal Structure, Grain Size, Atomic Structure
Analysis: Electron Diffraction

Characteristic: Chemical Composition, Impurities
Analysis: EDS, EDX, Energy Dispersive X-ray Spectroscopy

Characteristic: Morphology, Roughness, Topography
Analysis: AFM, Atomic Force Microscopy

Characteristic: Photoluminescence
Analysis: PL, PhotoLuminescence

Substrates

Silicon

Keywords

Notes

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