
Highly Uniform, Electroforming-Free, and Self-Rectifying Resistive Memory in the Pt/Ta2O5/HfO2-x/TiN Structure
Type:
Journal
Info:
Advanced Functional Materials, Volume 24, Issue 32, 2014, Pages 5086--5095
Date:
2014-05-26
Author Information
Name | Institution |
---|---|
Jung Ho Yoon | Seoul National University |
Seul Ji Song | Seoul National University |
Il-Hyuk Yoo | Seoul National University |
Jun Yeong Seok | Seoul National University |
Kyung Jean Yoon | Seoul National University |
Dae Eun Kwon | Seoul National University |
Tae Hyung Park | Seoul National University |
Cheol Seong Hwang | Seoul National University |
Films
Film/Plasma Properties
Substrates
Keywords
Notes
438 |