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Publication Information

Title: Microscopic origin of bipolar resistive switching of nanoscale titanium oxide thin films

Type: Journal

Info: Applied Physics Letters 95, 162108 (2009)

Date: 2009-09-01

DOI: http://dx.doi.org/10.1063/1.3251784

Author Information

Name

Institution

Korea Advanced Institute of Science and Technology

Korea Advanced Institute of Science and Technology

Electronics and Telecommunication Research Institute, (ETRI)

Korea Research Institute of Standards and Science (KRISS)

Films

Deposition Temperature = 180C

Film/Plasma Properties

Characteristic

Analysis

Diagnostic

Resistive Switching

I-V, Current-Voltage Measurements

Unknown

Microstructure

TEM, Transmission Electron Microscope

Unknown

Thickness

TEM, Transmission Electron Microscope

Unknown

Interfacial Layer

TEM, Transmission Electron Microscope

Unknown

Chemical Composition, Impurities

XPS, X-ray Photoelectron Spectroscopy

Unknown

Bonding States

XPS, X-ray Photoelectron Spectroscopy

Unknown

Chemical Composition, Impurities

ELS, EELS, Electron Energy Loss Spectroscopy

Unknown

Substrates

Keywords

Resistive Switch

Resistance RAM

Notes

1015



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