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Correlation between ferroelectricity and ferroelectric orthorhombic phase of HfxZr1-xO2 thin films using synchrotron x-ray analysis
Experimental and theoretical determination of the role of ions in atomic layer annealing
Crystalline AlN Interfacial Layer on GaN Using Plasma-Enhanced Atomic Layer Deposition
Effect of cycling on ultra-thin HfZrO4, ferroelectric synaptic weights
Plasma-Enhanced Atomic Layer Deposition of Nanostructured Gold Near Room Temperature
Lifetimes exceeding 1ms in 1-Ohm-cm boron-doped Cz-silicon
Type:
Journal
Info:
Solar Energy Materials and Solar Cells Volume 131, December 2014, Pages 51-57
Date:
2014-06-03
Author Information
| Name | Institution |
|---|---|
| Dominic C. Walter | Institute for Solar Energy Research Hamelin (ISFH) |
Films
Film/Plasma Properties
Substrates
Keywords
Notes
| 216 |