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Characterization of thin Al2O3/SiO2 dielectric stack for CMOS transistors
Designing Multifunctional Cobalt Oxide Layers for Efficient and Stable Electrochemical Oxygen Evolution
Hierarchical Atomic Layer Deposited V2O5 on 3D Printed Nanocarbon Electrodes for High-Performance Aqueous Zinc-Ion Batteries
Piezoelectric Properties of Zinc Oxide Thin Films Grown by Plasma-Enhanced Atomic Layer Deposition
Experimental and numerical analysis of the effects of ion bombardment in silicon oxide (SiO2) plasma enhanced atomic layer deposition (PEALD) processes
Bis(ethylcyclopentadienyl)nickel, (EtCp)2Ni, CAS# 31886-51-8
Where to buy
| Number | Vendor | Region | Link |
|---|---|---|---|
| 1 | Ereztech | 🇺🇸 | Bis(ethylcyclopentadienyl) nickel |
| 2 | Strem Chemicals, Inc. | 🇺🇸 | Bis(ethylcyclopentadienyl)nickel, min. 98% |
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Plasma Enhanced Atomic Layer Deposition Film Publications
Your search for publications using this chemistry returned 3 record(s). If there are too many results, you may want to use the multi-factor search to narrow the results.