Publication Information

Title: Enhanced electron field emission properties of high aspect ratio silicon nanowire-zinc oxide core-shell arrays

Type: Journal

Info: Phys. Chem. Chem. Phys., 2012, 14, 4614-4619

Date: 2012-01-24

DOI: http://dx.doi.org/10.1039/c2cp40238f

Author Information

Name

Institution

Nanyang Technological University

Nanyang Technological University

Nanyang Technological University

Nanyang Technological University

National University Singapore

Nanyang Technological University

Nanyang Technological University

Films

Deposition Temperature Range N/A

557-20-0

7782-44-7

Film/Plasma Properties

Characteristic

Analysis

Diagnostic

Electron Field Emission

Unknown

Unknown

Threshold Voltage

I-V, Current-Voltage Measurements

Asylum Research MFP-3D

Morphology, Roughness, Topography

SEM, Scanning Electron Microscopy

JEOL JSM-7600F

Crystallinity, Crystal Structure, Grain Size, Atomic Structure

TEM, Transmission Electron Microscope

JEOL 2100F

Crystallinity, Crystal Structure, Grain Size, Atomic Structure

Electron Diffraction

Unknown

Chemical Composition, Impurities

EDS, EDX, Energy Dispersive X-ray Spectroscopy

Unknown

Morphology, Roughness, Topography

AFM, Atomic Force Microscopy

Asylum Research MFP-3D

Photoluminescence

PL, PhotoLuminescence

Unknown

Substrates

Silicon

Keywords

Notes

129

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