About Plasma ALD, LLC

The Plasma Enhanced Atomic Layer Deposition Publication Database is developed and maintained by Plasma ALD, LLC, a developer and supplier of inductively coupled plasma (ICP) sources for plasma-enhanced atomic layer deposition (PEALD), atomic layer etch (ALE), thin-film etching, surface cleaning, surface modification, and research plasma systems.

Our ICP sources are designed for integration with existing ALD and vacuum-processing equipment. Plasma ALD also provides plasma-source integration, process-development, and troubleshooting assistance based on decades of experience with low-pressure plasma processing and PEALD systems.

Researchers, universities, equipment manufacturers, and laboratories looking for an ICP plasma source or assistance adding plasma capability to a vacuum system can learn more on our Plasma Sources page.

Micro-Raman Spectroscopy for Monitoring of Deposition Quality of High-k Stack Protective Layer onto Nanowire FET Chips for Highly Sensitive miRNA Detection

Type:
Journal
Info:
Biosensors 2018, 8, 72
Date:
2018-07-28

Author Information

Name Institution
Kristina A MalsagovaInstitute of Biomedical Chemistry
Tatyana O PleshakovaInstitute of Biomedical Chemistry
Andrey F KozlovInstitute of Biomedical Chemistry
Ivan D ShumovInstitute of Biomedical Chemistry
Mikhail A. IlnitskiiRussian Academy of Sciences
Andrey V. MiakonkikhMoscow Institute of Physics and Technology
Vladimir P. PopovRussian Academy of Sciences
Konstantin V. RudenkoRussian Academy of Sciences
Alexander V. GlukhovNovosibirsk Semiconductor Device Plant and Design Bureau
Igor N. KupriyanovRussian Academy of Sciences
Nina D. IvanovaSkryabin Moscow State Academy of Veterinary Medicine and Biotechnology
Alexander E. RogozhinMoscow Institute of Physics and Technology
Alexander I. ArchakovInstitute of Biomedical Chemistry
Yuri D. IvanovInstitute of Biomedical Chemistry

Films

Plasma HfO2


Plasma Al2O3


Film/Plasma Properties

Substrates

Silicon

Notes

1299