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The Plasma Enhanced Atomic Layer Deposition Publication Database is developed and maintained by Plasma ALD, LLC, a developer and supplier of inductively coupled plasma (ICP) sources for plasma-enhanced atomic layer deposition (PEALD), atomic layer etch (ALE), thin-film etching, surface cleaning, surface modification, and research plasma systems.

Our ICP sources are designed for integration with existing ALD and vacuum-processing equipment. Plasma ALD also provides plasma-source integration, process-development, and troubleshooting assistance based on decades of experience with low-pressure plasma processing and PEALD systems.

Researchers, universities, equipment manufacturers, and laboratories looking for an ICP plasma source or assistance adding plasma capability to a vacuum system can learn more on our Plasma Sources page.

Encapsulation method for atom probe tomography analysis of nanoparticles

Type:
Journal
Info:
Ultramicroscopy, Available online 24 February 2015
Date:
2015-04-28

Author Information

Name Institution
D.J. LarsonCAMECA Instruments Inc.
A.D. GiddingsCAMECA Instruments Inc.
Y. WuEindhoven University of Technology
Marcel A. VerheijenEindhoven University of Technology
T.J. ProsaCAMECA Instruments Inc.
Fred RoozeboomEindhoven University of Technology
K.P. RiceCAMECA Instruments Inc.
Erwin (W.M.M.) KesselsEindhoven University of Technology
B.P. GeiserCAMECA Instruments Inc.
T.F. KellyCAMECA Instruments Inc.

Films

Plasma Pt

Hardware used: Custom


CAS#: 7782-44-7

Thermal Al:ZnO


Film/Plasma Properties

Characteristic: Images
Analysis: APT, Atom Probe Tomography

Characteristic: Images
Analysis: TEM, Transmission Electron Microscope

Substrates

Notes

329