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The Plasma Enhanced Atomic Layer Deposition Publication Database is developed and maintained by Plasma ALD, LLC, a developer and supplier of inductively coupled plasma (ICP) sources for plasma-enhanced atomic layer deposition (PEALD), atomic layer etch (ALE), thin-film etching, surface cleaning, surface modification, and research plasma systems.

Our ICP sources are designed for integration with existing ALD and vacuum-processing equipment. Plasma ALD also provides plasma-source integration, process-development, and troubleshooting assistance based on decades of experience with low-pressure plasma processing and PEALD systems.

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Metal-oxide-based hole-selective tunneling contacts for crystalline silicon solar cells

Type:
Journal
Info:
Solar Energy Materials and Solar Cells, Volume 120, Part A, 2014, Pages 376 - 382
Date:
2013-07-10

Author Information

Name Institution
S. SmitEindhoven University of Technology
Diana Garcia-AlonsoEindhoven University of Technology
S. BordihnEindhoven University of Technology
M.S. HanssenEindhoven University of Technology
Erwin (W.M.M.) KesselsEindhoven University of Technology

Films

Plasma Al2O3


Thermal ZnO



CAS#: 7732-18-5

Thermal Al:ZnO


Film/Plasma Properties

Substrates

Silicon

Notes

613