Plasma-Enhanced Atomic Layer Deposition of Silver Thin Films
Info:
Chem. Mater., 2011, 23 (11), pp 2901–2907
Author Information
Films
Film/Plasma Properties
Analysis: EDS, EDX, Energy Dispersive X-ray Spectroscopy
Analysis: EDS, EDX, Energy Dispersive X-ray Spectroscopy
Analysis: SEM, Scanning Electron Microscopy
Analysis: AFM, Atomic Force Microscopy
Analysis: XRD, X-Ray Diffraction
Analysis: Four-point Probe
Analysis: Four-point Probe
Analysis: TOF-ERDA, Time-Of-Flight Elastic Recoil Detection Analysis
Analysis: RBS, Rutherford Backscattering Spectrometry
Substrates
Notes
| Aeronex Gatekeeper gas purifier used |
| Entegris Gatekeeper gas purifier used |
| 2 |