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Atomic layer deposition of high-mobility hydrogen-doped zinc oxide

Type:
Journal
Info:
Solar Energy Materials and Solar Cells, Volume 173, 2017, Pages 111 - 119
Date:
2017-05-17

Author Information

Name Institution
Bart MaccoEindhoven University of Technology
Harm C. M. KnoopsEindhoven University of Technology
Marcel A. VerheijenEindhoven University of Technology
W. BeyerForschungszentrum Jülich
Mariadriana CreatoreEindhoven University of Technology
Erwin (W.M.M.) KesselsEindhoven University of Technology

Films

Thermal ZnO



CAS#: 7732-18-5

Other H:ZnO



CAS#: 7732-18-5

CAS#: 1333-74-0

Film/Plasma Properties

Characteristic: Thickness
Analysis: Ellipsometry

Characteristic: Resistivity, Sheet Resistance
Analysis: Hall Measurements

Characteristic: Carrier Concentration
Analysis: Hall Measurements

Characteristic: Mobility
Analysis: Hall Measurements

Characteristic: Morphology, Roughness, Topography
Analysis: AFM, Atomic Force Microscopy

Characteristic: Crystallinity, Crystal Structure, Grain Size, Atomic Structure
Analysis: XRD, X-Ray Diffraction

Characteristic: Images
Analysis: TEM, Transmission Electron Microscope

Characteristic: Crystallinity, Crystal Structure, Grain Size, Atomic Structure
Analysis: Electron Diffraction

Characteristic: Thermal Effusion
Analysis: QMS, Quadrupole Mass Spectrometer

Substrates

ZnO

Notes

Supplement contains ZnO etch data and nice table of experimental results https://ars.els-cdn.com/content/image/1-s2.0-S0927024817302593-mmc1.pdf
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