Atomic layer deposition of high-mobility hydrogen-doped zinc oxide
Info:
Solar Energy Materials and Solar Cells, Volume 173, 2017, Pages 111 - 119
Author Information
Films
Film/Plasma Properties
Analysis: Hall Measurements
Analysis: Hall Measurements
Analysis: Hall Measurements
Analysis: AFM, Atomic Force Microscopy
Analysis: XRD, X-Ray Diffraction
Analysis: TEM, Transmission Electron Microscope
Analysis: Electron Diffraction
Analysis: QMS, Quadrupole Mass Spectrometer
Substrates
Notes
| Supplement contains ZnO etch data and nice table of experimental results https://ars.els-cdn.com/content/image/1-s2.0-S0927024817302593-mmc1.pdf |
| 1047 |