About Plasma ALD, LLC

The Plasma Enhanced Atomic Layer Deposition Publication Database is developed and maintained by Plasma ALD, LLC, a developer and supplier of inductively coupled plasma (ICP) sources for plasma-enhanced atomic layer deposition (PEALD), atomic layer etch (ALE), thin-film etching, surface cleaning, surface modification, and research plasma systems.

Our ICP sources are designed for integration with existing ALD and vacuum-processing equipment. Plasma ALD also provides plasma-source integration, process-development, and troubleshooting assistance based on decades of experience with low-pressure plasma processing and PEALD systems.

Researchers, universities, equipment manufacturers, and laboratories looking for an ICP plasma source or assistance adding plasma capability to a vacuum system can learn more on our Plasma Sources page.

High-resolution, high-aspect-ratio iridium-nickel composite nanoimprint molds

Type:
Journal
Info:
Journal of Vacuum Science & Technology B 34, 061804 (2016)
Date:
2016-10-28

Author Information

Name Institution
Chang-Sheng LeeA*STAR (Agency for Science, Technology and Research)
Yeong-Yuh LeeA*STAR (Agency for Science, Technology and Research)
Karen S. L. ChongA*STAR (Agency for Science, Technology and Research)
Li WangEulitha AG
Christian DaisEulitha AG
Francis ClubeEulitha AG
Harun H. SolakEulitha AG
Istvan MohacsiPaul Scherrer Institut
Christian DavidPaul Scherrer Institut
Roger BischofbergermicroSWISS AG

Films

Plasma Ir


Film/Plasma Properties

Characteristic: Images
Analysis: SEM, Scanning Electron Microscopy

Substrates

Silicon

Notes

860