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The Plasma Enhanced Atomic Layer Deposition Publication Database is developed and maintained by Plasma ALD, LLC, a developer and supplier of inductively coupled plasma (ICP) sources for plasma-enhanced atomic layer deposition (PEALD), atomic layer etch (ALE), thin-film etching, surface cleaning, surface modification, and research plasma systems.

Our ICP sources are designed for integration with existing ALD and vacuum-processing equipment. Plasma ALD also provides plasma-source integration, process-development, and troubleshooting assistance based on decades of experience with low-pressure plasma processing and PEALD systems.

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Synaptic Plasticity and Learning Behaviors Mimicked in Single Inorganic Synapses of Pt/HfOx/ZnOx/TiN Memristive System

Type:
Journal
Info:
Nanoscale Research Letters (2017) 12:65
Date:
2017-01-14

Author Information

Name Institution
Lai-Guo WangNanjing University
Wei ZhangNanjing University
Yan ChenNanjing University
Yanqiang CaoNanjing University
Aidong LiNanjing University
Di WuNanjing University

Films

Plasma TiN

Hardware used: Unknown


CAS#: 7664-41-7

Thermal ZnO

Hardware used: Unknown


CAS#: 7732-18-5

Thermal HfO2


Film/Plasma Properties

Characteristic: Memristor Characteristics
Analysis: Memristor Characterization

Substrates

Silicon

Notes

1031