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Plasma enhanced atomic layer deposition of titanium nitride-molybdenum nitride solid solutions

Type:
Journal
Info:
Journal of Vacuum Science & Technology A 39, 012407 (2021)
Date:
2020-12-01

Author Information

Name Institution
Md. Istiaque ChowdhuryLehigh University
Mark J. SowaVeeco Instruments
Alexander Campbell KozenUniversity of Maryland
Brandon A. KrickFlorida State University
Jewel HaikLehigh University
Tomas F. BabuskaFlorida State University
Nicholas C. StrandwitzLehigh University

Films


Plasma MoN



Film/Plasma Properties

Characteristic: Thickness
Analysis: Ellipsometry

Characteristic: Refractive Index
Analysis: Ellipsometry

Characteristic: Extinction Coefficient
Analysis: Ellipsometry

Characteristic: Resistive Switching
Analysis: Four-point Probe

Characteristic: Thickness
Analysis: XRR, X-Ray Reflectivity

Characteristic: Density
Analysis: XRR, X-Ray Reflectivity

Characteristic: Crystallinity, Crystal Structure, Grain Size, Atomic Structure
Analysis: XRD, X-Ray Diffraction

Characteristic: Stress
Analysis: XRD, X-Ray Diffraction

Characteristic: Chemical Composition, Impurities
Analysis: XPS, X-ray Photoelectron Spectroscopy

Substrates

Si(100)
SiO2

Notes

1597