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Controlling transition metal atomic ordering in two-dimensional Mo1-xWxS2 alloys
Type:
Journal
Info:
2D Materials 9 (2022) 025016
Date:
2022-02-14
Author Information
| Name | Institution |
|---|---|
| Jeff J P M Schulpen | Eindhoven University of Technology |
| Marcel A. Verheijen | Eindhoven University of Technology |
| Erwin (W.M.M.) Kessels | Eindhoven University of Technology |
| Vincent Vandalon | Eindhoven University of Technology |
| Ageeth A. Bol | Eindhoven University of Technology |
Films
Plasma MoS2
Plasma WS2
Plasma MoxW1-xS2
Film/Plasma Properties
Characteristic: Thickness
Analysis: Ellipsometry
Characteristic: Chemical Composition, Impurities
Analysis: XPS, X-ray Photoelectron Spectroscopy
Characteristic: Chemical Composition, Impurities
Analysis: RBS, Rutherford Backscattering Spectrometry
Characteristic: Raman Spectra
Analysis: Raman Spectroscopy
Characteristic: Photoluminescence
Analysis: PL, PhotoLuminescence
Characteristic: Images
Analysis: TEM, Transmission Electron Microscope
Characteristic: Crystallinity, Crystal Structure, Grain Size, Atomic Structure
Analysis: TEM, Transmission Electron Microscope
Substrates
| SiO2 |
Notes
| 1679 |