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Antiferromagnetism and p-type conductivity of nonstoichiometric nickel oxide thin films

Type:
Journal
Info:
InfoMat. 2020;1-6.
Date:
2019-11-28
DOI:
http://dx.doi.org/10.1002/inf2.12076

Author Information

Name Institution
Mari NapariUniversity of Cambridge
Zhigang XiaoAlabama A&M University
Tahmida N. HuqUniversity of Cambridge
Kim KisslingerBrookhaven National Laboratory
Tuhin MaityUniversity of Cambridge
Sam ChanceAlabama A&M University
Samuel BanksAlabama A&M University
Daisy GomersallUniversity of Cambridge
Kham M. NiangUniversity of Cambridge
Armin BarthelUniversity of Cambridge
Juliet E. ThompsonUniversity of Cambridge
Sami KinnunenUniversity of Jyväskylä
Kai ArstilaUniversity of Jyväskylä
Timo SajavaaraUniversity of Jyväskylä
Robert L. Z. HoyeUniversity of Cambridge
Andrew J. FlewittUniversity of Cambridge
Judith L. MacManus-DriscollUniversity of Cambridge

Films

Plasma NiOx

Hardware used: Custom Direct Capacitively Coupled Plasma
Nickel (II) acetylacetonate, anhydrous
CAS#: 3264-82-2
O2, Oxygen
CAS#: 7782-44-7
N2, Nitrogen
CAS#: 7727-37-9
Deposition Temperature = 200C

Film/Plasma Properties

Characteristic: Crystallinity, Crystal Structure, Grain Size, Atomic Structure
Analysis: XRD, X-Ray Diffraction
Diagnostic: -

Characteristic: Density
Analysis: XRR, X-Ray Reflectivity
Diagnostic: -

Characteristic: Morphology, Roughness, Topography
Analysis: AFM, Atomic Force Microscopy
Diagnostic: -

Characteristic: Microstructure
Analysis: HIM, Helium Ion Microscopy
Diagnostic: -

Characteristic: Chemical Composition, Impurities
Analysis: XPS, X-ray Photoelectron Spectroscopy
Diagnostic: -

Characteristic: Compositional Depth Profiling
Analysis: TOF-ERDA, Time-Of-Flight Elastic Recoil Detection Analysis
Diagnostic: -

Characteristic: Resistivity, Sheet Resistance
Analysis: van der Pauw sheet resistance
Diagnostic: -

Characteristic: Carrier Concentration
Analysis: van der Pauw sheet resistance
Diagnostic: -

Characteristic: Mobility
Analysis: van der Pauw sheet resistance
Diagnostic: -

Characteristic: Thermal Activation Energy
Analysis: Two-point Probe
Diagnostic: -

Characteristic: Magnetic Properties
Analysis: Magnetization
Diagnostic: -

Substrates

Silicon
SiO2
BSG, BoroSilicate Glass

Notes

1455