About Plasma ALD, LLC

The Plasma Enhanced Atomic Layer Deposition Publication Database is developed and maintained by Plasma ALD, LLC, a developer and supplier of inductively coupled plasma (ICP) sources for plasma-enhanced atomic layer deposition (PEALD), atomic layer etch (ALE), thin-film etching, surface cleaning, surface modification, and research plasma systems.

Our ICP sources are designed for integration with existing ALD and vacuum-processing equipment. Plasma ALD also provides plasma-source integration, process-development, and troubleshooting assistance based on decades of experience with low-pressure plasma processing and PEALD systems.

Researchers, universities, equipment manufacturers, and laboratories looking for an ICP plasma source or assistance adding plasma capability to a vacuum system can learn more on our Plasma Sources page.

Hydrophilic/hydrophobic surface of Al2O3 thin films grown by thermal and plasma-enhanced atomic layer deposition on plasticized polyvinyl chloride (PVC)

Type:
Journal
Info:
Surface & Coatings Technology 305 (2016) 158 - 164
Date:
2016-08-06

Author Information

Name Institution
Li-Chun WangNational Taiwan University
Yin-Yi HanNational Taiwan University Hospital
Kai-Chiang YangTaipei Medical University
Miin-Jang ChenNational Taiwan University
Hsin-Chih LinNational Taiwan University
Chung-Kwei LinTaipei Medical University
Yu-Tong HsuNational Taiwan University

Films


Plasma Al2O3


Film/Plasma Properties

Characteristic: Wetting Angle
Analysis: -

Characteristic: Chemical Composition, Impurities
Analysis: XPS, X-ray Photoelectron Spectroscopy

Characteristic: Chemical Composition, Impurities
Analysis: FTIR, Fourier Transform InfraRed spectroscopy

Characteristic: Morphology, Roughness, Topography
Analysis: -

Substrates

Polyvinylchloride, PVC

Notes

942