About Plasma ALD, LLC

The Plasma Enhanced Atomic Layer Deposition Publication Database is developed and maintained by Plasma ALD, LLC, a developer and supplier of inductively coupled plasma (ICP) sources for plasma-enhanced atomic layer deposition (PEALD), atomic layer etch (ALE), thin-film etching, surface cleaning, surface modification, and research plasma systems.

Our ICP sources are designed for integration with existing ALD and vacuum-processing equipment. Plasma ALD also provides plasma-source integration, process-development, and troubleshooting assistance based on decades of experience with low-pressure plasma processing and PEALD systems.

Researchers, universities, equipment manufacturers, and laboratories looking for an ICP plasma source or assistance adding plasma capability to a vacuum system can learn more on our Plasma Sources page.

Metallic nanoparticle-based strain sensors elaborated by atomic layer deposition

Type:
Journal
Info:
Applied Physics Letters 110, 123103 (2017)
Date:
2017-03-20

Author Information

Name Institution
Etienne PuyooUniversité Lyon
Christophe MalhaireUniversité Lyon
Daniel ThomasUniversité Lyon
Rémi RafaëlUniversité Lyon
Mohamed R'MiliUniversité Lyon
Annie MalchèreUniversité Lyon
Lucian RoibanUniversité Lyon
Siddardha KonetiUniversité Lyon
Matthieu BugnetUniversité Lyon
Andreï SabacUniversité Lyon
M. Le BerreUniversité Lyon

Films

Plasma Pt


Thermal Al2O3


Film/Plasma Properties

Characteristic: Images
Analysis: TEM, Transmission Electron Microscope

Characteristic: Particle Size Distribution
Analysis: TEM, Transmission Electron Microscope

Characteristic: Images
Analysis: TEM, Transmission Electron Microscope

Substrates

Al2O3
SiO2
Polyimide

Notes

1410