Charge trapping characteristics of Au nanocrystals embedded in remote plasma atomic layer-deposited Al2O3 film as the tunnel and blocking oxides for nonvolatile memory applications
Info:
Journal of Vacuum Science & Technology A 30, 01A104 (2012)
Author Information
Films
Film/Plasma Properties
Analysis: OES, Optical Emission Spectroscopy
Analysis: XPS, X-ray Photoelectron Spectroscopy
Analysis: AES, Auger Electron Spectroscopy
Analysis: TEM, Transmission Electron Microscope
Analysis: C-V, Capacitance-Voltage Measurements
Substrates
Notes