Thin film GaP for solar cell application
Type:
Journal
Info:
Journal of Physics: Conference Series 741 (2016) 012088
Date:
2016-09-22
Author Information
| Name | Institution |
|---|---|
| Ivan A. Morozov | St. Petersburg Academic University |
| Alexander S. Gudovskikh | St. Petersburg Academic University |
| Dmitry A. Kudryashov | St. Petersburg Academic University |
| E.V. Nikitina | St. Petersburg Academic University |
| Jean-Paul Kleider | GeePs Group of electrical engineering - Paris |
| A V Myasoedov | Ioffe Institute |
| V Levitskiy | Research and development center for thin-film technologies in energetics |
Films
Plasma GaP
Film/Plasma Properties
Characteristic: Morphology, Roughness, Topography
Analysis: SEM, Scanning Electron Microscopy
Characteristic: Thickness
Analysis: SEM, Scanning Electron Microscopy
Characteristic: Morphology, Roughness, Topography
Analysis: AFM, Atomic Force Microscopy
Characteristic: Images
Analysis: TEM, Transmission Electron Microscope
Characteristic: Interlayer
Analysis: TEM, Transmission Electron Microscope
Characteristic: Crystallinity, Crystal Structure, Grain Size, Atomic Structure
Analysis: Electron Diffraction
Characteristic: Refractive Index
Analysis: Ellipsometry
Characteristic: Extinction Coefficient
Analysis: Ellipsometry
Characteristic: Photoluminescence
Analysis: PL, PhotoLuminescence
Substrates
| Si(100) |
Notes
| 911 |