PEALD of Zirconium Oxide Using Tetrakis(ethylmethylamino)zirconium and Oxygen
Info:
Electrochemical and Solid-State Letters, 7 (12) F81-F84 (2004)
Author Information
| Name |
Institution |
| Sun Jin Yun | Electronics and Telecommunication Research Institute, (ETRI) |
| Jung Wook Lim | Electronics and Telecommunication Research Institute, (ETRI) |
| Jin Ho Lee | Electronics and Telecommunication Research Institute, (ETRI) |
Films
Film/Plasma Properties
Analysis: AES, Auger Electron Spectroscopy
Analysis: RBS, Rutherford Backscattering Spectrometry
Analysis: RBS, Rutherford Backscattering Spectrometry
Analysis: C-V, Capacitance-Voltage Measurements
Analysis: C-V, Capacitance-Voltage Measurements
Analysis: I-V, Current-Voltage Measurements
Analysis: I-V, Current-Voltage Measurements
Analysis: TEM, Transmission Electron Microscope
Analysis: TEM, Transmission Electron Microscope
Substrates
Notes