About Plasma ALD, LLC

The Plasma Enhanced Atomic Layer Deposition Publication Database is developed and maintained by Plasma ALD, LLC, a developer and supplier of inductively coupled plasma (ICP) sources for plasma-enhanced atomic layer deposition (PEALD), atomic layer etch (ALE), thin-film etching, surface cleaning, surface modification, and research plasma systems.

Our ICP sources are designed for integration with existing ALD and vacuum-processing equipment. Plasma ALD also provides plasma-source integration, process-development, and troubleshooting assistance based on decades of experience with low-pressure plasma processing and PEALD systems.

Researchers, universities, equipment manufacturers, and laboratories looking for an ICP plasma source or assistance adding plasma capability to a vacuum system can learn more on our Plasma Sources page.

On-wafer fabrication of etched-mirror UV-C laser diodes with the ALD-deposited DBR

Type:
Journal
Info:
Applied Physics Letters 116, 122101 (2020)
Date:
2020-03-04

Author Information

Name Institution
Tadayoshi SakaiNagoya University
Maki KushimotoNagoya University
Ziyi ZhangAsahi Kasei Corporation
Naoharu SugiyamaNagoya University
Leo J. SchowalterNagoya University
Yoshio HondaNagoya University
Chiaki SasaokaNagoya University
Hiroshi AmanoNagoya University

Films

Plasma Al2O3



Film/Plasma Properties

Characteristic: Refractive Index
Analysis: Ellipsometry

Characteristic: Images
Analysis: TEM, Transmission Electron Microscope

Characteristic: Reflectivity
Analysis: UV-VIS Spectroscopy

Substrates

AlN
SiO2
AlGaN

Notes

1478