RF Characterization of Novel Superconducting Materials and Multilayers
Type:
Conference Proceedings
Info:
SRF2019, Dresden, Germany
Date:
2019-06-30
Author Information
| Name | Institution |
|---|---|
| T. Oseroff | Cornell University |
| M. Liepe | Cornell University |
| B. Moeckly | STAR Cryoelectronics |
| Mark J. Sowa | Veeco Instruments |
| Zhipei Sun | Cornell University |
Films
Plasma NbN
Hardware used: Veeco - Ultratech - Cambridge NanoTech Fiji
CAS#: 210363-27-2
CAS#: 7727-37-9
CAS#: 1333-74-0
Plasma NbTiN
Hardware used: Veeco - Ultratech - Cambridge NanoTech Fiji
CAS#: 210363-27-2
CAS#: 7727-37-9
CAS#: 1333-74-0
Film/Plasma Properties
Characteristic: Superconductivity
Analysis: -
Characteristic: Chemical Composition, Impurities
Analysis: XPS, X-ray Photoelectron Spectroscopy
Characteristic: Crystallinity, Crystal Structure, Grain Size, Atomic Structure
Analysis: XRD, X-Ray Diffraction
Characteristic: Morphology, Roughness, Topography
Analysis: SEM, Scanning Electron Microscopy
Substrates
| AlN |
| Nb |
Notes
| 1736 |