About Plasma ALD, LLC

The Plasma Enhanced Atomic Layer Deposition Publication Database is developed and maintained by Plasma ALD, LLC, a developer and supplier of inductively coupled plasma (ICP) sources for plasma-enhanced atomic layer deposition (PEALD), atomic layer etch (ALE), thin-film etching, surface cleaning, surface modification, and research plasma systems.

Our ICP sources are designed for integration with existing ALD and vacuum-processing equipment. Plasma ALD also provides plasma-source integration, process-development, and troubleshooting assistance based on decades of experience with low-pressure plasma processing and PEALD systems.

Researchers, universities, equipment manufacturers, and laboratories looking for an ICP plasma source or assistance adding plasma capability to a vacuum system can learn more on our Plasma Sources page.

Materials Pushing the Application Limits of Wire Grid Polarizers further into the Deep Ultraviolet Spectral Range

Type:
Journal
Info:
Adv. Optical Mater. 2016, 4, 1780--1786
Date:
2016-06-08

Author Information

Name Institution
Thomas SiefkeFriedrich-Schiller-Universität Jena
Stefanie KrokerTechnische Universität Braunschweig
Kristin PfeifferFriedrich-Schiller-Universität Jena
Oliver PuffkyFriedrich-Schiller-Universität Jena
Kay DietrichFriedrich-Schiller-Universität Jena
Daniel FrantaMasaryk University
Ivan OhlídalMasaryk University
Adriana SzeghalmiFriedrich-Schiller-Universität Jena
Ernst-Bernhard KleyFriedrich-Schiller-Universität Jena
Andreas TünnermannFriedrich-Schiller-Universität Jena

Films

Plasma TiO2


Film/Plasma Properties

Characteristic: Thickness
Analysis: Ellipsometry

Characteristic: Refractive Index
Analysis: Ellipsometry

Characteristic: Transmittance
Analysis: Optical Transmission

Characteristic: Reflectivity
Analysis: Optical Reflectivity

Substrates

SiO2

Notes

877