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Our ICP sources are designed for integration with existing ALD and vacuum-processing equipment. Plasma ALD also provides plasma-source integration, process-development, and troubleshooting assistance based on decades of experience with low-pressure plasma processing and PEALD systems.

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Comparison of the cohesive and delamination fatigue properties of atomic-layer-deposited alumina and titania ultrathin protective coatings deposited at 200°C

Type:
Journal
Info:
Sci. Technol. Adv. Mater. 15 (2014) 015003
Date:
2013-11-05

Author Information

Name Institution
Farzad Sadeghi-TohidiGeorgia Institute of Technology
David SametGeorgia Institute of Technology
Samuel GrahamGeorgia Institute of Technology
Olivier N PierronGeorgia Institute of Technology

Films


Plasma Al2O3


Film/Plasma Properties

Characteristic: Thickness
Analysis: SEM, Scanning Electron Microscopy

Characteristic: Images
Analysis: SEM, Scanning Electron Microscopy

Characteristic: Crystallinity, Crystal Structure, Grain Size, Atomic Structure
Analysis: SEM, Scanning Electron Microscopy

Substrates

Silicon
Al2O3

Notes

1384