Negative charge trapping effects in Al2O3 films grown by atomic layer deposition onto thermally oxidized 4H-SiC
Type:
Journal
Info:
AIP ADVANCES 6, 075021 (2016)
Date:
2016-07-18
Author Information
| Name | Institution |
|---|---|
| Emanuela Schilirò | National Research Council (CNR - Italy) |
| Raffaella Lo Nigro | National Research Council (CNR - Italy) |
| Patrick Fiorenza | National Research Council (CNR - Italy) |
| Fabrizio Roccaforte | National Research Council (CNR - Italy) |
Films
Film/Plasma Properties
Characteristic: Microstructure
Analysis: TEM, Transmission Electron Microscope
Characteristic: Morphology, Roughness, Topography
Analysis: AFM, Atomic Force Microscopy
Characteristic: Interface Trap Density
Analysis: C-V, Capacitance-Voltage Measurements
Characteristic: Fixed Charge Density
Analysis: C-V, Capacitance-Voltage Measurements
Characteristic: Breakdown Voltage
Analysis: C-V, Capacitance-Voltage Measurements
Characteristic: Flat Band Voltage
Analysis: C-V, Capacitance-Voltage Measurements
Characteristic: Flat Band Voltage Shift
Analysis: C-V, Capacitance-Voltage Measurements
Characteristic: Hysteresis
Analysis: C-V, Capacitance-Voltage Measurements
Characteristic: Leakage Current
Analysis: I-V, Current-Voltage Measurements
Characteristic: Thickness
Analysis: Ellipsometry
Substrates
| SiO2 |
Notes
| 880 |