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Nanochemistry, nanostructure, and electrical properties of Ta2O5 film deposited by atomic layer deposition and plasma-enhanced atomic layer deposition

Type:
Journal
Info:
Journal of Vacuum Science & Technology B 24, 2230-2235 (2006)
Date:
2006-07-10
DOI:
http://dx.doi.org/10.1116/1.2335432

Author Information

Name Institution
Diefeng GuArizona State University
Jing LiArizona State University
Sandwip K. DeyArizona State University
Henk De WaardASM Microchemistry Oy
Steven MarcusASM Microchemistry Oy

Films

Plasma Ta2O5

Hardware used: Unknown
Ta(OC2H5)5, Ta(OEt)5, Tantalum(V) ethoxide
CAS#: 6074-84-6
O2, Oxygen
CAS#: 7782-44-7
Deposition Temperature = 300C

Thermal Ta2O5

Hardware used: Unknown
Ta(OC2H5)5, Ta(OEt)5, Tantalum(V) ethoxide
CAS#: 6074-84-6
H2O, Water
CAS#: 7732-18-5
Deposition Temperature = 300C

Film/Plasma Properties

Characteristic: Thickness
Analysis: Ellipsometry
Diagnostic: -

Characteristic: Thickness
Analysis: TEM, Transmission Electron Microscope
Diagnostic: JEOL 2010F

Characteristic: Interfacial Layer
Analysis: ELS, EELS, Electron Energy Loss Spectroscopy
Diagnostic: -

Characteristic: EOT, Equivalent Oxide Thickness
Analysis: C-V, Capacitance-Voltage Measurements
Diagnostic: HP 4284A LCR

Characteristic: Dielectric Constant, Permittivity
Analysis: C-V, Capacitance-Voltage Measurements
Diagnostic: HP 4284A LCR

Characteristic: Fixed Charge Density
Analysis: C-V, Capacitance-Voltage Measurements
Diagnostic: HP 4284A LCR

Characteristic: Capacitance
Analysis: C-V, Capacitance-Voltage Measurements
Diagnostic: HP 4284A LCR

Characteristic: Leakage Current
Analysis: I-V, Current-Voltage Measurements
Diagnostic: Tektronix 372

Characteristic: Breakdown Voltage
Analysis: I-V, Current-Voltage Measurements
Diagnostic: Tektronix 372

Substrates

Si with native oxide

Notes

Work possibly done on ASM system.
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