About Plasma ALD, LLC

The Plasma Enhanced Atomic Layer Deposition Publication Database is developed and maintained by Plasma ALD, LLC, a developer and supplier of inductively coupled plasma (ICP) sources for plasma-enhanced atomic layer deposition (PEALD), atomic layer etch (ALE), thin-film etching, surface cleaning, surface modification, and research plasma systems.

Our ICP sources are designed for integration with existing ALD and vacuum-processing equipment. Plasma ALD also provides plasma-source integration, process-development, and troubleshooting assistance based on decades of experience with low-pressure plasma processing and PEALD systems.

Researchers, universities, equipment manufacturers, and laboratories looking for an ICP plasma source or assistance adding plasma capability to a vacuum system can learn more on our Plasma Sources page.

Ferroelectricity in hafnia controlled via surface electrochemical state

Type:
Journal
Info:
Nat. Mater. 22, 1144-1151 (2023)
Date:
2023-06-23

Author Information

Name Institution
Kyle P. KelleyOak Ridge National Laboratory
Anna N. MorozovskaNational Academy of Science of Ukraine
Eugene A. EliseevNational Academy of Science of Ukraine
Yongtao LiuOak Ridge National Laboratory
Shelby S. FieldsUniversity of Virginia
Samantha T. JaszewskiUniversity of Virginia
Takanori MimuraUniversity of Virginia
Sebastian CalderonCarnegie Mellon University
Elizabeth C. DickeyCarnegie Mellon University
Jon F. IhlefeldUniversity of Virginia
Sergei V. KalininUniversity of Tennessee

Films


Film/Plasma Properties

Characteristic: Polarization
Analysis: Ferroelectrical Testing

Characteristic: Piezoelectric properties
Analysis: PFM Piezo Force Microscopy

Substrates

TaN

Notes

1743