Low-Temperature Conformal Atomic Layer Deposition of SiNx Films Using Si2Cl6 and NH3 Plasma
Author Information
| Name | Institution |
|---|---|
| Rafaiel A. Ovanesyan | Colorado School of Mines |
| Dennis M. Hausmann | Lam Research Corporation |
| Sumit Agarwal | Colorado School of Mines |
Films
Plasma SiNx
Film/Plasma Properties
Substrates
| SiO2 |
Notes
| 355 |