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Highly stable all-inorganic CsPbBr3 nanocrystals film encapsulated with alumina by plasma-enhanced atomic layer deposition

Type:
Journal
Info:
Mater. Express, Vol. 8, No. 5, 2018
Date:
2018-08-14

Author Information

Name Institution
Yiyuan ZhuNanchang University
Yuandan HeNanchang University
Jinhui GongNanchang University
Xingcan FengNanchang University
Hong PengNanchang University
Wei WangNanchang University
Haiyang HeNanchang University
Hu LiuNanchang University
Li WangNanchang University

Films

Plasma Al2O3


Thermal Al2O3


Film/Plasma Properties

Characteristic: Thickness
Analysis: Ellipsometry

Characteristic: Morphology, Roughness, Topography
Analysis: SEM, Scanning Electron Microscopy

Characteristic: Interfacial Layer
Analysis: XPS, X-ray Photoelectron Spectroscopy

Substrates

Silicon
CsPbBr3

Notes

1282