About Plasma ALD, LLC

The Plasma Enhanced Atomic Layer Deposition Publication Database is developed and maintained by Plasma ALD, LLC, a developer and supplier of inductively coupled plasma (ICP) sources for plasma-enhanced atomic layer deposition (PEALD), atomic layer etch (ALE), thin-film etching, surface cleaning, surface modification, and research plasma systems.

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Researchers, universities, equipment manufacturers, and laboratories looking for an ICP plasma source or assistance adding plasma capability to a vacuum system can learn more on our Plasma Sources page.

Nanoscale Encapsulation of Hybrid Perovskites Using Hybrid Atomic Layer Deposition

Type:
Journal
Info:
J. Phys. Chem. Lett. 2022, 13, 4082-4089
Date:
2022-04-28

Author Information

Name Institution
Jue GongFlorida State University
Moein AdnaniFlorida State University
Brendon T. JonesFlorida State University
Yan XinNational High Magnetic Field Laboratory
Sisi WangFlorida State University
Sawankumar V. PatelFlorida State University
Eric LochnerFlorida State University
Hedi MattoussiFlorida State University
Yan-Yan HuFlorida State University
Hanwei GaoFlorida State University

Films

Thermal Al2O3


Plasma Al2O3


Film/Plasma Properties

Characteristic: Images
Analysis: TEM, Transmission Electron Microscope

Characteristic: Microstructure
Analysis: TEM, Transmission Electron Microscope

Characteristic: Chemical Composition, Impurities
Analysis: EDS, EDX, Energy Dispersive X-ray Spectroscopy

Characteristic: Morphology, Roughness, Topography
Analysis: AFM, Atomic Force Microscopy

Characteristic: Photoluminescence
Analysis: PL, PhotoLuminescence

Substrates

MAPbI3, methylammonium lead iodide
2-mcpEtOH

Notes

1715