About Plasma ALD, LLC

The Plasma Enhanced Atomic Layer Deposition Publication Database is developed and maintained by Plasma ALD, LLC, a developer and supplier of inductively coupled plasma (ICP) sources for plasma-enhanced atomic layer deposition (PEALD), atomic layer etch (ALE), thin-film etching, surface cleaning, surface modification, and research plasma systems.

Our ICP sources are designed for integration with existing ALD and vacuum-processing equipment. Plasma ALD also provides plasma-source integration, process-development, and troubleshooting assistance based on decades of experience with low-pressure plasma processing and PEALD systems.

Researchers, universities, equipment manufacturers, and laboratories looking for an ICP plasma source or assistance adding plasma capability to a vacuum system can learn more on our Plasma Sources page.

The important role of water in growth of monolayer transition metal dichalcogenides

Type:
Journal
Info:
2D Materials 4 (2017) 021024
Date:
2017-02-08

Author Information

Name Institution
Christoph KastlLawrence Berkeley National Laboratory
Christopher T ChenLawrence Berkeley National Laboratory
Tevye R KuykendallLawrence Berkeley National Laboratory
Brian ShevitskiLawrence Berkeley National Laboratory
Thomas P DarlingtonLawrence Berkeley National Laboratory
Nicholas J BorysLawrence Berkeley National Laboratory
Andrey KrayevAIST-NT
P James SchuckLawrence Berkeley National Laboratory
Shaul AloniLawrence Berkeley National Laboratory
Adam M. SchwartzbergLawrence Berkeley National Laboratory

Films

Plasma WO3


Plasma MoOx



CAS#: 7782-44-7

Film/Plasma Properties

Characteristic: Thickness
Analysis: Ellipsometry

Substrates

SiO2

Notes

1036