About Plasma ALD, LLC

The Plasma Enhanced Atomic Layer Deposition Publication Database is developed and maintained by Plasma ALD, LLC, a developer and supplier of inductively coupled plasma (ICP) sources for plasma-enhanced atomic layer deposition (PEALD), atomic layer etch (ALE), thin-film etching, surface cleaning, surface modification, and research plasma systems.

Our ICP sources are designed for integration with existing ALD and vacuum-processing equipment. Plasma ALD also provides plasma-source integration, process-development, and troubleshooting assistance based on decades of experience with low-pressure plasma processing and PEALD systems.

Researchers, universities, equipment manufacturers, and laboratories looking for an ICP plasma source or assistance adding plasma capability to a vacuum system can learn more on our Plasma Sources page.

Photoluminescence blue shift of indium phosphide nanowire networks with aluminum oxide coating

Type:
Journal
Info:
physica status solidi (RRL) - Rapid Research Letters Volume 8, Issue 7, pages 663-667, 2014
Date:
2014-04-28

Author Information

Name Institution
David M. FryaufUniversity of California - Santa Cruz
Junce ZhangUniversity of California - Santa Cruz
Kate J. NorrisUniversity of California - Santa Cruz
Juan J. Diaz LeonUniversity of California - Santa Cruz
Michael M. OyeUniversity of California - Santa Cruz
Min WeiUniversity of California - Santa Cruz
Nobuhiko P. KobayashiUniversity of California - Santa Cruz

Films

Plasma Al2O3


Film/Plasma Properties

Characteristic: Photoluminescence
Analysis: PL, PhotoLuminescence

Characteristic: Raman Spectra
Analysis: Raman Spectroscopy

Characteristic: Images
Analysis: TEM, Transmission Electron Microscope

Characteristic: Crystallinity, Crystal Structure, Grain Size, Atomic Structure
Analysis: Electron Diffraction

Substrates

InP

Notes

1446