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The Plasma Enhanced Atomic Layer Deposition Publication Database is developed and maintained by Plasma ALD, LLC, a developer and supplier of inductively coupled plasma (ICP) sources for plasma-enhanced atomic layer deposition (PEALD), atomic layer etch (ALE), thin-film etching, surface cleaning, surface modification, and research plasma systems.

Our ICP sources are designed for integration with existing ALD and vacuum-processing equipment. Plasma ALD also provides plasma-source integration, process-development, and troubleshooting assistance based on decades of experience with low-pressure plasma processing and PEALD systems.

Researchers, universities, equipment manufacturers, and laboratories looking for an ICP plasma source or assistance adding plasma capability to a vacuum system can learn more on our Plasma Sources page.

Tunable conduction type of solution-processed germanium nanoparticle based field effect transistors and their inverter integration

Type:
Journal
Info:
Phys. Chem. Chem. Phys., 2015, 17, 22106-22114
Date:
2015-08-04

Author Information

Name Institution
Zeynep MericFriedrich-Alexander University Erlangen-Nuremberg
Christian MehringerFriedrich-Alexander University Erlangen-Nuremberg
Nicolas KarpsteinFriedrich-Alexander University Erlangen-Nuremberg
Michael P. M. JankFraunhofer Institute for Integrated Systems and Device Technology (IISB)
Wolfgang PeukertFriedrich-Alexander University Erlangen-Nuremberg
L. FreyFriedrich-Alexander University Erlangen-Nuremberg

Films

Plasma Al2O3


Film/Plasma Properties

Substrates

Notes

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