About Plasma ALD, LLC

The Plasma Enhanced Atomic Layer Deposition Publication Database is developed and maintained by Plasma ALD, LLC, a developer and supplier of inductively coupled plasma (ICP) sources for plasma-enhanced atomic layer deposition (PEALD), atomic layer etch (ALE), thin-film etching, surface cleaning, surface modification, and research plasma systems.

Our ICP sources are designed for integration with existing ALD and vacuum-processing equipment. Plasma ALD also provides plasma-source integration, process-development, and troubleshooting assistance based on decades of experience with low-pressure plasma processing and PEALD systems.

Researchers, universities, equipment manufacturers, and laboratories looking for an ICP plasma source or assistance adding plasma capability to a vacuum system can learn more on our Plasma Sources page.

Characterization of CVD graphene permittivity and conductivity in micro-/millimeter wave frequency range

Type:
Journal
Info:
AIP ADVANCES 6, 095014 (2016)
Date:
2016-09-06

Author Information

Name Institution
Yunqiu WuUniversity of Electronic Science and Technology of China
Yun WuNanjing Electronic Device Institute
Kai KangUniversity of Electronic Science and Technology of China
Yuanfu ChenUniversity of Electronic Science and Technology of China
Yanrong LiUniversity of Electronic Science and Technology of China
Tangsheng ChenNanjing Electronic Device Institute
Yuehang XuUniversity of Electronic Science and Technology of China

Films

Plasma Al2O3


Film/Plasma Properties

Substrates

Graphene

Notes

849