About Plasma ALD, LLC

The Plasma Enhanced Atomic Layer Deposition Publication Database is developed and maintained by Plasma ALD, LLC, a developer and supplier of inductively coupled plasma (ICP) sources for plasma-enhanced atomic layer deposition (PEALD), atomic layer etch (ALE), thin-film etching, surface cleaning, surface modification, and research plasma systems.

Our ICP sources are designed for integration with existing ALD and vacuum-processing equipment. Plasma ALD also provides plasma-source integration, process-development, and troubleshooting assistance based on decades of experience with low-pressure plasma processing and PEALD systems.

Researchers, universities, equipment manufacturers, and laboratories looking for an ICP plasma source or assistance adding plasma capability to a vacuum system can learn more on our Plasma Sources page.

Trapping and reliability issues in GaN-based MIS HEMTs with partially recessed gate

Type:
Journal
Info:
Microelectronics Reliability 2015
Date:
2015-11-30

Author Information

Name Institution
Gaudenzio MeneghessoUniversity of Padova
Matteo MeneghiniUniversity of Padova
Davide BisiUniversity of Padova
Isabella RossettoUniversity of Padova
Tian-Li WuIMEC
Marleen Van HoveIMEC
Denis MarconIMEC
Steve StoffelsIMEC
Stefaan DecoutereIMEC
Enrico ZanoniUniversity of Padova

Films

Plasma SiNx

Hardware used: Unknown


Thermal Al2O3

Hardware used: Unknown


Film/Plasma Properties

Substrates

Notes

429