Matteo Meneghini Plasma Enhanced Atomic Layer Deposition Film Publications

Your search for plasma enhanced atomic layer deposition publications authored by Matteo Meneghini returned 5 record(s).

Number	Title
1	Reliability and failure physics of GaN HEMT, MIS-HEMT and p-gate HEMTs for power switching applications: Parasitic effects and degradation due to deep level effects and time-dependent breakdown phenomena
2	Reliability and parasitic issues in GaN-based power HEMTs: a review
3	Impact of gate insulator on the dc and dynamic performance of AlGaN/GaN MIS-HEMTs
4	Trapping and reliability issues in GaN-based MIS HEMTs with partially recessed gate
5	Time-Dependent Breakdown Mechanisms and Reliability Improvement in Edge Terminated AlGaN/GaN Schottky Diodes Under HTRB Tests