Characteristics of Ti-Capped Co Films Deposited by a Remote Plasma ALD Method Using Cyclopentadienylcobalt Dicarbonyl
Author Information
| Name | Institution |
|---|---|
| Keunwoo Lee | Hanyang University |
| Keunjun Kim | Hanyang University |
| Taeyong Park | Hanyang University |
| Hyeongtag Jeon | Hanyang University |
| Youngjin Lee | Hynix Semiconductor |
| Jeongtae Kim | Hynix Semiconductor |
| Seungjin Yeom | Hynix Semiconductor |
Films
Film/Plasma Properties
Substrates
| Si(100) |
Notes
| 1011 |