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Atomic Layer Epitaxy of Group IV Materials: Surface Processes, Thin Films, Devices and Their Characterization

Type:
Other
Info:
Final technical report to Office of the Chief of Naval Research
Date:
1996-09-01

Author Information

Name Institution
R. F. DavisNorth Carolina State University
S. BedairNorth Carolina State University
N. A. El-MasryNorth Carolina State University
Z. SitarNorth Carolina State University

Films

Plasma SiC

Hardware used: Custom

CAS#: 1590-87-0


CAS#: 7664-41-7


CAS#: 1333-74-0

Film/Plasma Properties

Characteristic: Transistor Characteristics
Analysis: Transistor Characterization

Substrates

Silicon

Notes

1192