Tuning of undoped ZnO thin film via plasma enhanced atomic layer deposition and its application for an inverted polymer solar cell
Info:
AIP ADVANCES 3, 102114 (2013)
Author Information
Films
Film/Plasma Properties
Analysis: Four-point Probe
Analysis: SEM, Scanning Electron Microscopy
Analysis: AFM, Atomic Force Microscopy
Analysis: XRD, X-Ray Diffraction
Analysis: PL, PhotoLuminescence
Analysis: I-V, Current-Voltage Measurements
Analysis: I-V, Current-Voltage Measurements
Analysis: I-V, Current-Voltage Measurements
Analysis: I-V, Current-Voltage Measurements
Substrates
Notes