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Designing Multifunctional Cobalt Oxide Layers for Efficient and Stable Electrochemical Oxygen Evolution

Type:
Journal
Info:
Adv. Mater. Interfaces 2022, 9, 2200582
Date:
2022-05-11
DOI:
https://doi.org/10.1002/admi.202200582

Author Information

Name Institution
Matthias KuhlTechnical University of Munich
Alex HenningTechnical University of Munich
Lukas HallerTechnical University of Munich
Laura I. WagnerTechnical University of Munich
Chang-Ming JiangNational Taiwan University
Verena StreibelTechnical University of Munich
Ian D. SharpTechnical University of Munich
Johanna EichhornTechnical University of Munich

Films

Plasma CoOx

Hardware used: Veeco - Ultratech - Cambridge NanoTech Fiji
cobaltacene, bis(cyclopentadienyl)cobalt, Cp2Co
CAS#: 1277-43-6
O2, Oxygen
CAS#: 7782-44-7
Deposition Temperature = 100C

Film/Plasma Properties

Characteristic: Chemical Composition, Impurities
Analysis: XPS, X-ray Photoelectron Spectroscopy
Diagnostic: Specs PHOIBOS 150

Characteristic: Morphology, Roughness, Topography
Analysis: AFM, Atomic Force Microscopy
Diagnostic: Bruker Dimension ICON

Characteristic: Hardness
Analysis: Scratch Testing
Diagnostic: Bruker Multimode V

Characteristic: Adhesion
Analysis: Scratch Testing
Diagnostic: Bruker Multimode V

Characteristic: Density
Analysis: XRR, X-Ray Reflectivity
Diagnostic: Rigaku Smartlab

Characteristic: Crystallinity, Crystal Structure, Grain Size, Atomic Structure
Analysis: XRD, X-Ray Diffraction
Diagnostic: Rigaku Smartlab

Characteristic: Refractive Index
Analysis: Ellipsometry
Diagnostic: J.A. Woollam M-2000X

Characteristic: Extinction Coefficient
Analysis: Ellipsometry
Diagnostic: J.A. Woollam M-2000X

Characteristic: Chemical Composition, Impurities
Analysis: XANES, X-ray Absorption Near-Edge Spectroscopy
Diagnostic: Synchrotron

Characteristic: Microstructure
Analysis: EXAFS, Extended X-ray Absorption Fine Structure
Diagnostic: Synchrotron

Characteristic: Electrochemical Performance
Analysis: Electrochemical Analysis
Diagnostic: Custom

Substrates

Si with native oxide
SiO2

Notes

1672