Bis(ethylcyclopentadienyl)nickel, (EtCp)₂Ni, CAS# 31886-51-8

Your search for publications using this chemistry returned 3 record(s).

Number	Title
1	In Situ Synchrotron X-Ray Diffraction Analysis of Phase Transformation in Epitaxial Metastable hcp Nickel Thin Films, Prepared via Plasma-Enhanced Atomic Layer Deposition
2	Characteristics of NiO films prepared by atomic layer deposition using bis(ethylcyclopentadienyl)-Ni and O₂ plasma
3	Growth and Characterization of Metastable Hexagonal Nickel Thin Films via Plasma-Enhanced Atomic Layer Deposition

Bis(ethylcyclopentadienyl)nickel, (EtCp)2Ni, CAS# 31886-51-8