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Passivation of Al2O3/TiO2 on monocrystalline Si with relatively low reflectance

Type:
Journal
Info:
2016 J. Phys. D: Appl. Phys. 49 245105
Date:
2016-04-15

Author Information

Name Institution
Chun-Ti LuNational Taiwan University
Yu-Shiang HuangNational Taiwan University
Chee Wee LiuNational Taiwan University

Films

Plasma Al2O3

Hardware used: Unknown


Plasma TiO2

Hardware used: Unknown


Film/Plasma Properties

Characteristic: Photoluminescence
Analysis: PL, PhotoLuminescence

Substrates

Silicon

Notes

825