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The Plasma Enhanced Atomic Layer Deposition Publication Database is developed and maintained by Plasma ALD, LLC, a developer and supplier of inductively coupled plasma (ICP) sources for plasma-enhanced atomic layer deposition (PEALD), atomic layer etch (ALE), thin-film etching, surface cleaning, surface modification, and research plasma systems.

Our ICP sources are designed for integration with existing ALD and vacuum-processing equipment. Plasma ALD also provides plasma-source integration, process-development, and troubleshooting assistance based on decades of experience with low-pressure plasma processing and PEALD systems.

Researchers, universities, equipment manufacturers, and laboratories looking for an ICP plasma source or assistance adding plasma capability to a vacuum system can learn more on our Plasma Sources page.

Innovative scatterometry approach for self-aligned quadruple patterning (SAQP) process control

Type:
Conference Proceedings
Info:
Proc. SPIE 9778, Metrology, Inspection, and Process Control for Microlithography XXX, 977807
Date:
2016-02-21

Author Information

Name Institution
Anil Gunay-DemirkolIMEC
Efrain Altamirano SanchezIMEC
Stephane HeraudNova Measuring Instruments GmbH
Stephane GodnyIMEC
Anne-Laure CharleyIMEC
Philippe LerayIMEC
Ronen UrenskiNova Measuring Instruments LTD
Oded CohenNova Measuring Instruments LTD
Igor TurovetsNova Measuring Instruments LTD
Shay WolflingNova Measuring Instruments LTD

Films

Plasma SiO2

Hardware used: ASM Eagle XP8


Film/Plasma Properties

Substrates

Silicon

Notes

814